The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2003

Filed:

Jul. 11, 2001
Applicant:
Inventors:

Yen-Liang Kuan, Taipei, TW;

Tsung-Yu Wang, Taipei, TW;

Shih-Jen Kuo, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 2/700 ;
U.S. Cl.
CPC ...
G01R 2/700 ;
Abstract

A variable resistance measuring loop having a compensational function for environmental factors is provided. The variable resistance measuring loop includes a central processing unit; a variable resistance VR connected between first and second terminals of the central processing unit, as well as a transistor Q and resistance R coupled to respective terminals of the central processing unit, and a capacitor C coupled with the transistor Q to a center contact of the variable resistance VR. During operation, the variable resistance measuring loop establishes at least one of two discharging loop modes wherein discharge of the capacitor C occurs through one of either a resistance portion RA or a resistance portion RB of the variable resistance VR.


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