The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Jun. 12, 2000
Ramachandra Ganesh Shenoy, Danbury, CT (US);
Henri-Pierre Valero, Tokyo, JP;
Schlumberger Technology Corporation, Ridgefield, CT (US);
Abstract
Methods for downhole waveform tracking and sonic labeling employ “tracking algorithms” and Bayesian analysis to classify STC waveforms. More particularly, according to the tracking part of the invention, a probability model is built to distinguish true “arrivals” (e.g. compressional, shear, etc.) from “false alarms” (e.g. noise) before the arrivals are classified. The probability model maps the “continuity” of tracks (slowness/time over depth) and is used to determine whether sequences of measurements are sufficiently “continuous” to be classified as tracks. The probability model is used to evaluate the likelihood of the data in various possible classifications (hypotheses). Prior and posterior probabilities are constructed for each track using the tracking algorithm. The posterior probabilities are computed sequentially and recursively, updating the probabilities after each measurement frame at depth k is acquired. The classification part of the invention determines the hypotheses with the maximum “posterior probability” according to Bayes' Theorem.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile