The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2003

Filed:

Feb. 09, 2000
Applicant:
Inventors:

Susan S. Young, Buffalo, NY (US);

Hsien-Che Lee, Penfield, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A method for automatically locating instances of a specified image structure in digital images, comprising the steps of: providing a digital image; detecting simple features associated with the specified image structure in the digital image; for each detected feature, searching, in its spatial neighborhood, for a second or a plural of other features associated with the specified image structure; for each pair of plural of features detected, using an eigenvector classifier to distinguish the wanted features and the unwanted features by matching the eigenvector representation that is constructed from a set of training profiles; and labeling those image regions that are found to be consistent with the specified image structure in the classifying step.


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