The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Jun. 27, 2000
Mauricio Huerta Alva, Boise, ID (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method for identifying faults contributing to a data transfer error in a tape drive. The method includes calculating and comparing a long-term error rate and a short-term error sample. Based upon such calculation and comparison, a pre-selected error recovery procedure may be initialized. The long-term error rate equals a total number of bytes of data transfer error divided by a total number of bytes processed. A short-term error sample includes a number of bytes of data transfer error in a predetermined number of sequential blocks of data divided by the total number of bytes transferred in the predetermined number of sequential blocks of data. The method calculates and monitors a predetermined number of short-term error samples for a predetermined number of sequential blocks of data defining a window. Under normal operational conditions where head/media interface is free of debris, short-term error samples would have values slightly and randomly larger or smaller than long-term error rate. As debris accumulates gradually at head/media interface, the value of succeeding short-term error samples will be larger than the long-term error rate.