The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Mar. 30, 2001
Applicant:
Inventor:
Hiroshi Yamazaki, Tokyo, JP;
Assignee:
Nagase Sangyo Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 ;
U.S. Cl.
CPC ...
G01R 1/073 ;
Abstract
A prober capable of enhancing accuracy of a test intended. The prober includes prober needles arranged so as to be kept contacted with a laminate formed by laminating thermal transfer regulating members on each other and provided on a probe card. Such arrangement of the laminate restrains heat of the probe card from being transmitted through the probe needles to devices on a semiconductor wafer which is a specimen to be tested.