The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2003

Filed:

Jul. 02, 2001
Applicant:
Inventors:

Akishige Ito, Tokyo, JP;

Yoshiki Yanagisawa, Tokyo, JP;

Jun Kikuchi, Tokyo, JP;

Nobukazu Banjo, Tokyo, JP;

Sanjay Gupta, Tokyo, JP;

Mitsuru Shinagawa, Tokyo, JP;

Tadao Nagatsuma, Tokyo, JP;

Hakaru Kyuragi, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/1308 ;
U.S. Cl.
CPC ...
G01R 3/1308 ;
Abstract

An electro-optic probe has a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic or magneto-optic element provided with a reflection film on an end surface thereof, a separator provided between the laser diode and electro-optic or magneto-optic element which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film and two photodiodes which transform the beam reflected by the separator. A member of weak dielectric material, such as a glass plate, overlies the electro-optic or magneto-optic element at the end of the probe to protect the element, or the element is at the end of the probe and is exposed.


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