The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Nov. 14, 2001
Yazaki Corporation, Tokyo, JP;
Abstract
A wiper control device in which an abnormal condition of a FET is detected by distinguishing an action of an overheat-cutting protective function normally difficult to be detected with measuring the drain voltage of the FET and by which the control of the pertinent FET is restrained upon the detection of abnormality so as to prevent a short circuit in the wiper control device from occurring. When an FETB (Qb) is set on, whether or not a drain voltage Vd is lower than Vpe ({fraction (l/2)}VG) is judged (step S ), and if lower, it is judged that the drain and ground is short-circuited, that is, an overheat-cutting protective function is acted, and “1” is added to the number of times of short circuit detection Perror (step S ). It is judged whether or not the added value of the number of times of short circuit detection Perror reaches a reference value (step S ). If the reference value is reached, it is judged that the drain and ground is actually short-circuited, that is, an overheat-cutting protective function is acted, and each action of a FETA (Qa) and FETB (Qb) is halted (step S ).