The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Aug. 28, 2001
Richard Aufrichtig, Mountain View, CA (US);
Paul R. Granfors, Sunnyvale, CA (US);
Douglas Albagli, Clifton Park, NY (US);
George E. Possin, Niskayuna, NY (US);
John M. Boudry, Waukesha, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method is provided for identifying detector elements in a solid state X-ray detector susceptible to causing line artifacts due to faulty detector elements that leak charge. A portion of the X-ray detector is covered by a radiation occluding material and the detector is exposed to a level of radiation sufficient to reach a predetermined threshold in the exposed portion of the detector. An image representative of the radiation is acquired and further analyzed to determine whether line artifacts exist. Data lines found to exhibit line artifacts are stored in the image processor.