The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2003
Filed:
Nov. 07, 2001
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
An eye's optical characteristic measuring system, comprising an index projection system for projecting an index image on a fundus of an eye under testing, a photodetection optical system for guiding the index image toward a photoelectric detector, a simulation image calculating unit for calculating each of images of target images formed when a plurality of target images different in size are respectively projected on the fundus of the eye under testing based on a light amount intensity distribution of the index image detected on the photoelectric detector, and a visual acuity calculating unit for calculating a visual acuity value of the eye under testing, wherein the simulation image calculating unit calculates light amount intensity distributions in each of predetermined meridian directions of the images of the target images, and the visual acuity calculating unit detects a plurality of light amount intensity distribution values based on the light amount intensity distributions and calculates the visual acuity value of the eye under testing based on the plurality of light amount intensity distribution values.