The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
Jun. 12, 2001
Applicant:
Inventors:
Steven M. Crooks, Chelmsford, MA (US);
Shawn M. Verbout, Chelmsford, MA (US);
Assignee:
Alphatech, Inc., Burlington, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04R 1/500 ;
U.S. Cl.
CPC ...
H04R 1/500 ;
Abstract
A method and system that include a first measurement signal and a second measurement signal that can be input to first and second filters. The filters can be subject to a first constraint to minimize the energy difference between the first and second measurement signals on a per frequency basis, and subject to a second constraint that includes a model frequency and phase response. By adapting the filters subject to the two constraints, coherent differences between the two measurement signals can be identified. In one embodiment, the system can be applied to Synthetic Aperture Radar (SAR) data.