The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
Dec. 14, 2000
Applicant:
Inventor:
Loi Han, Alhambra, CA (US);
Assignee:
Microtek International Inc., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract
An optical, multi-resolution scanning apparatus for scanning transparent or opaque objects including a high resolution lens, a low resolution lens, a flip mirror switch which alternates between high resolution mode and low resolution mode of scanning, a flip mirror switch which alternates between transmissive mode and reflective mode of scanning whereby high and low resolution scanning of opaque and/or transparent objects may be accomplished through movement of flip mirror switches, without transverse movement of the lens assembly.