The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
Feb. 06, 2002
Hisanori Akiyama, Shinjyuku-ku, JP;
Masahiro Jinbo, Shinjyuku-ku, JP;
Toshiro Yoda, Shinjyuku-ku, JP;
Hoya Corporation, Tokyo, JP;
Abstract
The invention provides an automatic lens meter comprising an optical system forming a pattern image by projecting a pattern created by a pattern creating member and measuring optical properties of a lens based on the displacement of the pattern image from a baseline position wherein the examined lens is not in the path of rays in the optical system to a measuring position wherein the examined lens is in the path of the rays. The lens meter includes an image sensor for detecting the position of the pattern image using four line sensors and disposed on a pattern image forming plane and arranged in a cross shape, and the pattern creating member forms a pattern image having a quadrangular shape on the pattern image forming plane so that each line sensor intersects a side of the quadrangle, thereby facilitating accurate measurement of desired optical properties.