The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2003

Filed:

Apr. 21, 1999
Applicant:
Inventor:

Takeshi Fukada, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/136 ;
U.S. Cl.
CPC ...
G02F 1/136 ;
Abstract

There is provided a highly reliable semiconductor device in which electrostatic breakdown can be prevented. A diamond-like carbon (DLC) film is formed on a surface of an insulating substrate, and thereafter, a thin film transistor is formed on the insulating substrate. This DLC film allows charges of static electricity to flow and can prevent electrostatic breakdown of the thin film transistor.


Find Patent Forward Citations

Fukada, Takeshi. (2003). Semiconductor device and method of manufacturing the same (U.S. Patent No. 6621535). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6621535

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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