The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
May. 02, 2002
Applicant:
Inventor:
Takafumi Watanabe, Tokyo, JP;
Assignee:
Allied Telesis K.K., , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 1/9177 ;
U.S. Cl.
CPC ...
H03K 1/9177 ;
Abstract
A semiconductor device malfunction preventive circuit S is disposed in a macrocell logic cell of a semiconductor device used in an electronic device . A signal in an output pin or in a signal line is returned to the semiconductor device malfunction preventive circuit S as a pin feedback and monitored. When a predetermined state is detected, an abnormality detecting signal SIG for resetting the operation of the electronic device is outputted.