The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
Dec. 28, 2000
Jeffrey A. Wolk, Half Moon Bay, CA (US);
Sherri Ann Biondi, Menlo Park, CA (US);
J. Wallace Parce, Palo Alto, CA (US);
Morten J. Jensen, San Francisco, CA (US);
Anne R. Kopf-Sill, Portola Valley, CA (US);
Caliper Technologies Corp., Mountain View, CA (US);
Abstract
Ultra-high throughput systems and methods are used for sampling large numbers of different materials from surfaces of substantially planar library storage components. The systems and methods typically employ: microfluidic devices having integrated capillary elements for carrying out the analysis of the sampled materials; library storage components, e.g., planar solid substrates, capable of retaining thousands, tens of thousands and hundreds of thousands of different materials in small areas; sensing systems for allowing rapid and accurate sampling of the materials by the microfluidic devices, and associated instrumentation for control and analysis of the overall operation of these systems.