The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2003

Filed:

Mar. 15, 2001
Applicant:
Inventors:

Gregg A. Johnson, Fairfax, VA (US);

Bryan L. Althouse, Davidsonville, MD (US);

Assignee:

Optinel Systems, Inc., Elkridge, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/008 ;
U.S. Cl.
CPC ...
H04B 1/008 ;
Abstract

The invention includes a method and apparatus for monitoring wavelength of an optical channel. A tunable optical bandpass filter is used to correlate a signal from an optical transmission line with a signal from a reference light source. The signal from the reference light source passes through a reference gas cell. The absorption lines of the reference gas provide a known calibration standard against which measured values may be compared. The invention finds applications in optical transmission systems, including wavelength division multiplexed and dense wavelength division multiplexed (WDM and DWDM) optical communication systems.


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