The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

Nov. 30, 1999
Applicant:
Inventors:

Hari Balachandran, Dallas, TX (US);

Ken Butler, Plano, TX (US);

Jayashree Saxena, Richardson, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 2/728 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 2/728 ;
Abstract

A system for generating a pruned diagnostic list of potential bridging faults in a circuit includes a pattern generator operable to generate test patterns for testing a circuit and a tester in communication with the pattern generator that is operable to apply the test patterns to the circuit and generate a plurality of resultant vectors. The system also includes a stuck-at fault dictionary including a list of a plurality of nets of the circuit, each net having at least one resultant vector that indicates a potential stuck-at fault at the net. The system further includes a test analysis tool in communication with the pattern generator and the tester, the test analysis tool operable to create an initial logical diagnostic list of tested nets of the circuit associated with the potential stuck-at faults indicated in the stuck-at fault dictionary, the initial logical diagnostic list created in response to the generated plurality of resultant vectors. The system also includes a diagnostic tool in communication with the test analysis tool and the tester, the diagnostic tool operable to create a final logical diagnostic list using the resultant vectors, stuck-at fault dictionary, and the initial logical diagnostic list, the final logical diagnostic list having a plurality of potential bridging faults ranked in order of logical probability.


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