The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

Sep. 29, 2000
Applicant:
Inventor:

Edmund G. Lee, Palo Alto, CA (US);

Assignee:

Pharsight Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract

The present invention is directed to a method and mechanism to selectively evaluate data items and search queries for privacy violations. According to an embodiment of the invention, attributes of a data item are identified and quantified to evaluate its potential to violate privacy interests. Search queries can be evaluated before accessing the records according to an embodiment, which improves operating efficiency and provides additional privacy protections. The query evaluation determines whether to disallow a query or withhold a query result if an individual or a small group of individuals can be identified by the results or if variables revealed will violate privacy policies. Also, the invention enables a provider of information to systematically evaluated the selectivity and visibility of attributes that are analyzed to allow or disallow queries and to set thresholds for different combinations of attributes. This allows implementation of different privacy policies, which may vary based on the database, the attributes, and/or the source of the query.


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