The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

May. 14, 1999
Applicant:
Inventor:

Chakravarthy K. Allamsetty, Milpitas, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/728 ; G01R 3/100 ;
U.S. Cl.
CPC ...
G01R 2/728 ; G01R 3/100 ;
Abstract

A system and method for testing a circuit implemented on a programmable logic device. A host processor is coupled to the programmable logic device via an interface device, which has a plurality of signal pins for configuring the programmable logic device. Selected pins of the interface device are connected to selected input pins of the programmable logic device. Test vectors from the host processor are applied to the selected input pins of the programmable logic device via the interface device, and the states of one or more signals appearing on one or more output pins of the device are analyzed.


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