The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Jul. 31, 2001
Peter J. Ireland, Austin, TX (US);
Tao Li, Houston, TX (US);
Wayne Wright, Round Rock, TX (US);
Padmanaban Namasivayam, Austin, TX (US);
Schlumberger Technology Corporation, Austin, TX (US);
Abstract
A method for aligning measurements of a hostile environment includes synchronizing at least two clocks, wherein at least a first clock is in the hostile environment, measuring characteristics of the hostile environment, aligning time domain curves of the collected measurements, correlating the curves using one or more events recorded by each clock, and correcting the curves by adding one or more time offsets. The offsets may be added to a found resent event or at other locations on the time domain curve. A second clock may be located outside the hostile environment or within a same or similar hostile environment. The collecting the measurements may be taken by a first measurement tool in a first device near the first clock and in at least a second device coupled to a second clock.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile