The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Apr. 19, 2002
Erhard Paul Artur Klotz, Neumeunster, DE;
Reiner Koppe, Hamburg, DE;
Hermann Schomberg, Hamburg, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method of reconstructing images from cone beam projection data from an examination zone ( ) of an object to be examined. The cone beam projection data is acquired by means of an X-ray device which includes an X-ray source ( ) and an X-ray image intensifier ( ), the X-ray source ( ) being guided along a trajectory around the examination zone ( ) in order to acquire the projection data. First projection data are then acquired from the examination zone ( ) in a first mode of operation of the X-ray image intensifier ( ) which involves a low resolution. For a sub-zone ( ) of the examination zone ( ) second projection data is acquired in a second mode of operation of the X-ray image intensifier ( ) which involves a high resolution. Subsequently, the first and second projection data is combined so as to form third projection data. The third projection data is represented by the second projection data in the sub-zone ( ) of the examination zone ( ) and by the first projection data in the remaining part ( ) of the examination zone ( ). The images are reconstructed on the basis of the third projection data. The invention also relates to a corresponding X-ray device, notably a C-arm X-ray device.