The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Aug. 13, 2001
Arndt Gruber, München, DE;
Ralf Schneider, München, DE;
Bernhard Ruf, Taufkirchen, DE;
Norbert Wirth, Unterschleissheim, DE;
Infineon Technologies AG, Munich, DE;
Abstract
An electronic circuit in an integrated circuit having memory cells is described. The circuit permits information to be written to particular memory cells only once, so that subsequent writing to the particular memory cells is blocked. The circuit is used in a test structure for integrated circuits on a wafer. A method for testing integrated circuits on a wafer that are connected to a test apparatus is also described. Once the supply voltage to a first circuit to be tested has been turned on, a preliminary test is carried out to ascertain parameters that need to be set. The supply voltage is then applied to a next circuit to be tested, a preliminary test is carried out, and memory cells have information written to them, until the parameters have been set for all the connected circuits to be tested. The test apparatus then carries out the actual operational test in parallel for all the connected circuits to be tested.