The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Aug. 30, 2001
Applicant:
Inventor:
Masahiro Kuroiwa, Nagano, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/106 ;
U.S. Cl.
CPC ...
G01B 1/106 ;
Abstract
Light is transmitted through a compressing clamp which clamps the liquid crystal display panel , and the spectrum of light is obtained by a spectrometer . A cell thickness is detected based on a wavelength or a frequency at which the spectrum has the minimum or maximum value. The obtained cell thickness is compared with a desired value, and a pressure control unit supplies the compressing clamp with a fluid in accordance with the result of the comparison.
Kuroiwa, Masahiro. (2003). Cell thickness detection method, cell thickness control system, and manufacturing method for liquid crystal device (U.S. Patent No. 6618156). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6618156
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile