The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

Sep. 07, 1999
Applicant:
Inventor:

Futoshi Ishida, Takatsuki, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/188 ;
U.S. Cl.
CPC ...
G01N 2/188 ;
Abstract

A system and method of visually inspecting a transparent body and a translucent body comprises applying light to a reverse surface of an object to be inspected by a transmission light source, and applying light, at a low angle, to at least one of an obverse surface and the reverse surface of the object to be inspected by a reflection light source. Concave defects and adherents of the object to be inspected are detected by use of transmitted light emitted from the transmission light source, and adherents of the object to be inspected are detected by use of reflected scattered light emitted from the reflection light source.


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