The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Mar. 09, 2000
Applicant:
Inventors:
Ching-Yeu Wei, Schenecctady, NY (US);
Jianqiang Liu, Clifton Park, NY (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/700 ;
U.S. Cl.
CPC ...
H01L 2/700 ;
Abstract
An imager includes a photodiode array, each photodiode having an associated switching device, such as a thin-film transistor, addressable via a scan line. A data line for reading out from the photodiodes is formed first on a glass substrate, allowing the data line to be optimized in terms of thickness for conductivity.
Wei, Ching-Yeu. (2003). Low noise and high yield data line structure for imager (U.S. Patent No. 6617561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6617561
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