The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

Jan. 06, 1999
Applicant:
Inventors:

Shinichi Nakamura, Osaka, JP;

Kunihiko Fukutsuka, Nabikino, JP;

Yasushi Hanano, Osaka, JP;

Assignee:

Omega Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/300 ;
U.S. Cl.
CPC ...
G01N 3/300 ;
Abstract

The present invention provides an evaluation method and an evaluation system of free halogen concentration which eliminate the necessity of early exchanging or recycling of catalysts, as compared with a conventional method or system. In the present evaluation method of free halogen concentration, a main flow path of a sample liquid for evaluation and a sub-region that communicates with the main flow path are formed, a potential-measuring electrode is installed in the main path, while a reference electrode is installed in the sub-region at a position where free halogen in the sample liquid has been decomposed. Moreover, free halogen in the sample liquid is decomposed by a free-halogen decomposing substance in the sub-region, and the free halogen concentration is evaluated from the electric potential difference between the reference electrode and the potential-measuring electrode.


Find Patent Forward Citations

Nakamura, Shinichi. (2003). Evaluation method and evaluation system of free hypohalous acid concentration (U.S. Patent No. 6617168). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6617168

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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