The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Oct. 04, 2002
Yeming Gu, Suwanee, GA (US);
NCR Corporation, Dayton, OH (US);
Abstract
Techniques for using a scan pattern to estimate imaging information for an object reflecting the scan pattern are described. As an object is brought within range of a scan window, a scan beam tracing out a scan pattern comprising a plurality of scan lines causes reflection of the scan beam back into the scan window to produce a scanner signal based on reflections of the scan beam. The time at which the scanner signal indicates the presence of an object is noted and this timing information is mapped to position information identifying the position of the scan beam. The timing and position information is used to estimate imaging information about the object, including position, size, shape and motion information.