The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
Feb. 09, 2000
Mark G. Lucera, Pine Hill, NJ (US);
Frank Check, San Jose, CA (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Philadelphia, PA (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
An analog scan data signal processor is disclosed, in which a time-domain non-linear substrate noise filter is provided before a first derivative signal generation stage so as to produce, as output, a substantially fixed zero-reference signal level whenever a signal level indicative of a bar code substrate is detected, and the signal level analog scan data signal, whenever a signal level indicative of a bar code element is detected. By virtue of the present invention, it is now possible to reduce the level of substrate noise signals within input analog scan data signals, prior to deriving first derivative signals for subsequent signal processing. Consequently, the accuracy of binary signal level detection within such analog scan data signal processors can be significantly improved, thereby improving the performance of bar code symbol reading systems within which such analog scan data signal processors are employed.