The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

Nov. 14, 2001
Applicant:
Inventors:

Axel Hauck, Karlsruhe, DE;

Martin Mayer, Ladenburg, DE;

Nikolaus Pfeiffer, Dover, NH (US);

Manfred Schneider, Bad Rappenau, DE;

Helmut Siegeritz, Kronshagen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 3/08 ;
U.S. Cl.
CPC ...
G03F 3/08 ;
Abstract

A method is proposed for generating a color profile using the determination of a mapping A′ of a device-independent process space Q of dimension m, m being a natural number, to a device-dependent process space K′ of dimension n, n being a natural number, for a first set of specific parameters, which is distinguished by the mapping being represented by a concatenation of mappings, which includes a known mapping A from Q to a device-dependent process space K of dimension n, n being a natural number, for another set of specific process parameters, which differs at least in one element from a first set of specific process parameters; and either of a mapping T from K to K′ or a self-mapping T by Q .


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