The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
May. 17, 2000
Eero Suomi, Hämeenlinna, FI;
Tapio Mäenpää, Helsinki, FI;
Arto Karjalainen, Kajaani, FI;
Metso Paper, Inc., Helsinki, FI;
Abstract
The invention concerns a method for detecting a contamination and damaging of a face ( ) that runs through a nip or nips (N . . . N ) in a calendar for paper. In the method vibrations occurring in connection with the constructions ( ) of a calendar are detected and processed. The vibrations are detected by at least one vibration detector ( ) fitted in connection with the bearing supports of calendar rolls ( ) or in connection with constructions ( ) related to said bearing supports. By the way of these vibration detectors the calendar roll(s) ( ) is/are identified from which the vibration derives. In the method , it is possible to observe the rotation of all of the rolls to be monitored and to measure vibration from any suitable point whatsoever, for example from the frame ( ) of the machine, by employing at least one vibration detector ( ), the time (T ) of the cycle of the vibration signal obtained from said detector(s) being compared with the numbers of revolutions of the rolls to be monitored. In this way, the source of the disturbance is determined, and action is taken in order to eliminate the disturbance.