The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Jun. 25, 2001
Applicant:
Inventor:

Risto Bell, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 ;
U.S. Cl.
CPC ...
G06F 9/45 ;
Abstract

A method and apparatus for verification of a semiconductor device design is disclosed that includes the determination of electrical distance for shapes of a design of a semiconductor device. In the present embodiment, the method includes, for each shape to be analyzed, growing from a seed disposed within a boundary shape to be analyzed. After each new growth step, a frontier edge or a frontier polygon is generated. No frontier edges or frontier polygons result from growth steps relating to boundary shapes that have fully traversed. Therefore, as each smaller shape is traversed, growth within the traversed shape is discontinued (no frontier edges or frontier polygons result). Thus, the growth regions of smaller shapes that have been traversed drop out, and are not included in subsequent growth steps, advantageously reducing memory requirements and run-time.


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