The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Jul. 03, 2000
Applicant:
Inventors:

C. Richard Unkle, Fairview, PA (US);

Nicholas Edward Roddy, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A method and apparatus for determining the root cause of no trouble found events in a machine is disclosed. The actual faults occurring during a predetermined time interval prior to the no trouble found event are analyzed and correlated with the no trouble found events in an effort to identify those actual faults that have a high correlation with each no trouble found event. If a high correlation is not found, then the no trouble found event is analyzed off-line to determine the root cause.


Find Patent Forward Citations

Unkle, C.. (2003). Method and apparatus for diagnosing difficult to diagnose faults in a complex system (U.S. Patent No. 6615367). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6615367

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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