The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Nov. 13, 2001
Attitude determination system and method with outer-loop gyro scale-factor non-linearity calibration
Applicant:
Inventors:
Rongsheng Li, Hacienda Heights, CA (US);
Yeong-Wei Wu, Rancho Palos Verdes, CA (US);
David L. Augenstein, Hermosa Beach, CA (US);
Assignee:
The Boeing Company, Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; B64G 1/28 ;
U.S. Cl.
CPC ...
G06F 1/900 ; B64G 1/28 ;
Abstract
A method and apparatus for calibrating rate sensor measurements to compensate for rate sensor scale factor non-linearities. An outer loop compensator compares current rate sensor scale factor estimates with the current scale factor non-linearity compensation, and deviations from the current non-linearity compensation are corrected in an updated compensation.
Quick Actions:
Li, Rongsheng. (2003). Attitude determination system and method with outer-loop gyro scale-factor non-linearity calibration (U.S. Patent No. 6615117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6615117
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