The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Jan. 31, 2000
Applicant:
Inventors:

Douglas J. Durrant, Mission Viejo, CA (US);

Gerald L. Hill, Huntington Beach, CA (US);

Linda S. Perez, Laguna Niguel, CA (US);

Assignee:

NCR Corporation, Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A method and system for providing a manufacturing information system is disclosed. The system comprises a means for receiving and storing in a data warehouse component identifiers for identifying component manufacturing parameters for a quantity of components. The system further includes product identifiers for identifying manufactured products. The system further comprises a relational means for relating the component identifiers with the product identifiers for the products in which the components are included. The system further comprises a means for receiving a sub-set of the product identifiers, wherein the sub-set of product identifiers is for identifying a sub-set of the products which have a variation in performance. The system further comprises an analytical tool for correlating at least one of the component identifiers with the received sub-set of product identifiers, thereby identifying the component manufacturing parameter identified by the at least one component identifier as a possible cause of the variation in performance.


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