The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Apr. 05, 1999
Applicant:
Inventor:

Minoru Fujita, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A light-and-shade inspection apparatus and method therefor include an image pick-up device for picking up an image of an object across a dimension (e.g., width) thereof to produce an image data, a projection operational portion for calculating a projection data by adding together a predetermined number of the image data, the image data being produced at each scan of the image pick-up device at a predetermined position along the width of the object, a background lightness operational portion for calculating, based on the projection data produced by the projection operational portion, a background lightness of the object across its width, and a difference operational portion for subtracting the background lightness produced by the background lightness operational portion from the image data produced by the image pick-up device, thereby substantially eliminating variations of the background lightness across the width of the object from the image data.


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