The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Jan. 23, 2001
Ioan Niculae Bogatu, San Diego, CA (US);
Jin-Soo Kim, San Diego, CA (US);
Fartech, Inc., San Diego, CA (US);
Abstract
A system for creating an image of the internal features of an object includes an X-ray source and detector array positioned to interpose the object between the X-ray source and the detector array. An X-ray beam is passed through the object along a first path. While passing through the object, the beam is successively filtered four times, each time with a different filter. The successive filtration of the beam results in the production of four electrical signals by the detector which are processed to create an image signal for the path. The process is repeated for a plurality of paths through the object and the resulting image signals are combined using traditional computer tomography techniques to produce an image of the object.