The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Dec. 07, 2001
Applicant:
Inventors:
Assignee:
Japan Tobacco Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/184 ;
U.S. Cl.
CPC ...
G01N 2/184 ;
Abstract
In an apparatus and a method for detecting impurities in a material, infrared rays or a plurality of specific wavelength components of the infrared rays are applied to a material (T) on a conveyor ( ), the respective reflection intensities of the specific wavelength components reflected by the material (T) are measured, the measured reflection intensities and the reflection intensities of specific wavelength components inherent to the material (T) are compared, and impurities in the material (T) are detected according to the result of the comparison.
Sato, Kiyomi. (2003). Apparatus for detecting impurities in material and detecting method therefor (U.S. Patent No. 6614531). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6614531
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