The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Oct. 25, 2000
Milton Russell Latta, San Jose, CA (US);
Wai Cheung Leung, San Jose, CA (US);
Bob C. Robinson, Hollister, CA (US);
Timothy Carl Strand, San Jose, CA (US);
Andrew Ching Tam, Saratoga, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An inspection system using laser light directed at an off-axis parabolic mirror which focuses the beam on the surface being inspected and also serves as the collector for scattered and specular light returned from the surface is described. Specular and scattered light returned from the surface onto the parabolic mirror is divided into appropriate fields and directed onto detectors. In the preferred embodiment a polarized laser is used in conjunction with a polarizing beam splitter and a quarter-wave plate to route the reflected beam to a detector while allowing the original beam to be directed through the same optics. The parabolic mirror and selected additional components may be commonly mounted on a translatable stage which is moved along a radius of the disk when the optical inspection is being performed. Other components of the system such as the laser can remain in a fixed position. The system of the invention can be used to inspect one or both planar surfaces of the disk by providing duplication of selected components appropriately oriented with respect to the second surface.