The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Sep. 18, 2001
Christopher Aubuchon, Palo Alto, CA (US);
Sascha Hallstein, Los Gatos, CA (US);
Nayna Networks, Inc., Milpitas, CA (US);
Abstract
A method (and system) for manufacturing an optical switching device. The method includes forming an array plate comprising at least one hundred sites from a first physical process, where each of the sites is for coupling to an optical fiber. The sites have a first spatial degree of error relative to an ideal mathematical grid of the sites. The first spatial degree of error is derived from at least the first physical process. The method forms a lens plate comprising a plurality of lenses from a second physical process. Each of the lenses is going to be coupled to at least one of the sites on the array plate. The lenses have a second spatial degree of error relative to a second mathematical grid of lenses. The second spatial degree of error is derived from at least the second physical process. The method then derives lens measurement values from each of the plurality of lenses. The method compares each of the site measurement values with its respective lens measurement value to determine an error measurement between the lens measurement values and the respective site measurement values at a first reference point. The method then shifts the site measurement values relative to the lens measurement values by a selected increment relative to the first reference point. The selected increment is an x-direction, a y-direction, or a theta direction, or any combination of these. The method repeats the comparing to derive an other error measurement after the site measurement values have been shifted and continuing to perform the comparing and shifting in an iterative manner to reduce and/or possibly minimize the error measurement between the site measurement values with its respective lens measurement values.