The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Apr. 15, 2002
Kazunaga Kobayashi, Sakura, JP;
Masahiro Kusakari, Sakura, JP;
Shimei Tanaka, Sakura, JP;
Matsuhiro Miyamoato, Sakura, JP;
Fujikura Ltd., Tokyo, JP;
Abstract
The present invention is provided for obtaining an apparatus and a method for accurately measuring a variation of a distortion of an optical fiber by excluding an apparent variation of the distortion of the optical fiber which is generated by a drift of a BOTDR waveform. The distortion measuring apparatus of the present invention comprises a sensor cable and a reference fiber which is connected with the sensor cable in series. The measured variation of the distortion of the sensor cable is corrected by subtracting the apparent variation of the distortion of the reference fiber from the measured variation of the distortion of the sensor cable. It is preferable that the reference fiber be housed in an thermostatic chamber and temperature of the reference fiber be maintained in a predetermined value within a range of 10 to 40° C. with an error of ±2° C.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile