The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2003
Filed:
Jun. 02, 1998
Mitsuru Yamashita, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
There has been raised a problem of how to make the measurement of characteristics of a solid state image pickup device easy to carry out, to shorten the measurement time and to increase the measurement accuracy. In order to solve the problem described above, the solid state image pickup device is operated to generate an output with an operating condition for an odd field made different from that for an even field. For example, a dark signal can be detected with the supply of read pulses for either odd or even fields halted typically at the same time as a playback signal is detected in a state of being shielded from light or a state of applying an incident light with a predetermined quantity. As a result, it is possible not only to measure a variety of characteristics merely under a plurality of conditions at the same time but also to further process outputs of the odd and even fields in order to measure still another characteristic such as a dark current generated by an image pickup area.