The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Nov. 17, 1998
Applicant:
Inventor:

Kevin M. Minckler, East Haven, CT (US);

Assignee:

Pitney Bowes Inc., Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/518 ;
U.S. Cl.
CPC ...
G01D 1/518 ;
Abstract

Apparatus and method for monitoring print quality produced by a digital printing mechanism in real-time. Print quality is measured by: generating a background reflectance signal representative of the reflectance of a substrate; scanning the image to generate a post-print reflectance signal; comparing the reflectance signal with the post-print reflectance signal; and, if the post-print reflectance signal is greater than a predetermined fraction of said reflectance signal, generating an output signal indicative of poor quality. In one embodiment of the invention, the output signal is also generated if the post-print reflectance signal is less than a predetermined minimum value.


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