The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6612150 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 02, 2003

Filed:

Mar. 06, 2002
Applicant:
Inventor:

Raghavan Srinivasan, Beavercreek, OH (US);

Assignee:

Wright State University, Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/56 ;
U.S. Cl.
CPC ...
G01N 3/56 ;
Abstract

The present invention provides a device for testing the abrasiveness of paper and other sheet materials. The device comprises a punching module, a feed module for moving the material, a holding module that holds the material while the punching module penetrated the material, and an instrument that records and analyzes the amount of force needed to punch through the material and then calculates the abrasive properties of the material. The punching module comprises a punching instrument for punching the material, a driving mechanism for operating the punching instrument, and a measurement system that measures the amount of the force required to punch the material. A method for using the device is also provided.


Find Patent Forward Citations

Srinivasan, Raghavan. (2003). Method and device for measuring abrasive properties of paper and other sheet materials (U.S. Patent No. 6612150). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6612150

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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