The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2003
Filed:
May. 18, 2000
Kiwamu Kase, Wako, JP;
Hideo Tashiro, Wako, JP;
Riken, , JP;
Abstract
(A) The surface shape of an object ( ) is measured by varying the position and/or direction of measurement, and a plurality of sets of partially measured data ( ) including the common parts ( ) are acquired, (B) for all the partially measured data ( ), the overlapped ranges ( ) of the adjacent common parts ( ) are determined within the measurement error ranges ( ), (C) when there are no superposition ranges ( ), it is decided that a combination is not possible, and (D) when there are overlapped ranges ( ), the common parts of each set of partially measured data are combined within the ranges. Thus, combined data can be created at a high accuracy from a plurality of sets of partially measured data based on a small number of repeated calculations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile