The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2003
Filed:
Apr. 20, 2000
Applicant:
Inventors:
Yuwu Zhang, Kawasaki, JP;
Masayoshi Uneme, Yamatokoriyama, JP;
Yasushi Fukaya, Niwa-gun, JP;
Kazuo Yamazaki, Sacramento, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G06F 1/500 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G06F 1/500 ;
Abstract
In coordinate and surface texture measurement in which measurement control is performed by a part program, a part program is analyzed to extract measurement information or measurement condition. The measurement condition is rewritably stored such that optimal measurement conditions of an actual measurement can be reflected in a part program, and such that the actual measurement conditions can be added to subsequent measurement control.