The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2003

Filed:

May. 24, 2001
Applicant:
Inventors:

Yuichi Yamashita, Kawagoe, JP;

Atsushi Maki, Hachioji, JP;

Fumio Kawaguchi, Hinode, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

A highly reliable optical measuring instrument for multi-channel simultaneous measurement has an intensity of light emitted from a light source modulated at different frequencies and the light is applied to multiple positions of a test object. The light which is detected from the test object is converted into electric signals by a photodiode, and modulation signals are detected by a lock-in amplifier module. The signals are processed as information on the test object interior by a processing unit. Light is applied sequentially from a light source in a preparatory measurement step prior to final measuring, and the signal level of the detection light is measured for each light applied position. A control unit controls light intensity and detection signal level to ensure that the difference in detection light levels is kept within a specified range.


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