The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2003

Filed:

Apr. 12, 2000
Applicant:
Inventors:

Ian A. Walmsley, Lyons, NY (US);

Christopher Iaconis, Santa Rosa, CA (US);

Assignee:

The University of Rochester, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

Amplitude and phase relative to an interferometrically established phase of ultrashort replica pulses ( ) utilizes spectral phase interforemetry for direct electric field reconstruction by frequency shifting chirp replica pulses ( ) of an optical pulse to be measured. The replicas of the pulses, relatively delayed in time, are generated by an interferometer ( ).


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Walmsley, Ian. (2003). Pulse measurement using frequency shifting techniques (U.S. Patent No. 6611336). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6611336

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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