The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2003
Filed:
Feb. 14, 2002
C. J. Anthony Fernando, Durham, NC (US);
James E. Swon, Chapel Hill, NC (US);
Varian, Inc., Palo Alto, CA (US);
Abstract
A sample analysis system comprises a plurality of media containers, a plurality of sample test sites, a plurality of media sampling lines, a plurality of optical source lines, a plurality of optical return lines, and an optical input selection device. Each media sampling line is adapted for transferring a quantity of media from a corresponding one of the media containers to a corresponding one of the sample test sites. Each optical source line has an optical source line input end and an optical source line output end. Each optical source line output end communicates with a corresponding one of the sample test sites. Each optical return line has an optical return line input end and an optical return line output end. Each optical return line input end communicates with a corresponding one of the sample test sites. The optical input selection device is rotatable about a first axis, and comprises a first internal optical fiber having a first input end and a first output end. The first input end is disposed collinearly with the first axis. The first output end is disposed at a radially offset distance from the first axis and is alignable with a selected one of the optical source line input ends.