The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2003

Filed:

Jan. 29, 1999
Applicant:
Inventor:

Seiji Funakawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/067 ;
U.S. Cl.
CPC ...
H01S 3/067 ;
Abstract

A wavelength-variable light source apparatus having a wavelength measurement function for measuring the wavelength characteristic of an object to be measured. In the apparatus, a CPU outputs control signals for controlling components of a light power meter section via a bus for controlling a light detection operation. When the CPU obtains light detection level data detected by the light power meter section from light passing through an object to be measured, the CPU stores the light detection level data for each wavelength in the object to be measured in an RAM and causes a display control section to display the light detection level on a display section. Further, the CPU executes wavelength analysis processing according to a wavelength analysis program stored in an ROM, analyzes the light wavelength characteristic of the object to be measured based on the light detection level data for each wavelength stored in the RAM, and causes the display control section to display the analysis result on the display section.


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