The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2003

Filed:

Oct. 01, 1999
Applicant:
Inventors:

Kenneth J. Geiszler, San Jose, CA (US);

Russel E. Walker, San Jose, CA (US);

Kenneth Alan Whiston, San Jose, CA (US);

Jon Kwong, San Jose, CA (US);

Dale Lindseth, San Jose, CA (US);

Assignee:

Keri Systems Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 5/22 ;
U.S. Cl.
CPC ...
H04Q 5/22 ;
Abstract

An object identification system and method detects the presence of a target object in a field of inspection and in one aspect of the invention, generates a first signal if the object is left in the field of inspection for more than a minimum threshold period of time. In a second aspect a second signal is generated if the object is introduced to the field of inspection more than a minimum threshold number of times (having been withdrawn from the field of inspection in the interim) within a minimum threshold period of time.


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